Reviewed-by: Kenneth Graunke <kenneth@whitecape.org>
Reviewed-by: Caio Marcelo de Oliveira Filho <caio.oliveira@intel.com>
Reviewed-by: Jordan Justen <jordan.l.justen@intel.com>
test_fuzz_compact_instruction() was attempting to modify the uint64_t
data array of a brw_inst through a pointer to uint32_t, which has
undefined behavior. This was causing the test_eu_compact unit test to
fail mysteriously for me on GCC 7 with some additional
harmless-looking changes I had applied to my tree, which happened to
affect the order instructions are emitted by GCC causing the bit
twiddling to be done after the clear_pad_bits() call which is supposed
to overwrite the same data through a pointer of different type,
leading to data corruption. A similar failure has been reported by
Vinson Lee on the master branch built with GCC 8.
Bugzilla: https://bugs.freedesktop.org/show_bug.cgi?id=105052
Tested-by: Vinson Lee <vlee@freedesktop.org>
Reviewed-by: Matt Turner <mattst88@gmail.com>
Note that there's no point in testing on G45, since its compaction is
the same as Gen5. Same logic applies to Gen7 variants and low-power
parts.
Reviewed-by: Scott D Phillips <scott.d.phillips@intel.com>
At the moment all the tests but test_eu_compact are actual C++ gtests.
To simplify things, we can move the gtest.la to the common TEST_LIBS.
As we're here, we can rename change the test extension [to .cpp] to
avoid using the confusing dummy.cpp.
Add a nice comment in the makefile for posterity.
Signed-off-by: Emil Velikov <emil.velikov@collabora.com>
Reviewed-by: Jason Ekstrand <jason@jlekstrand.net>
2017-03-13 11:16:35 +00:00
Renamed from src/intel/compiler/test_eu_compact.c (Browse further)
