mirror of
https://gitlab.freedesktop.org/mesa/mesa.git
synced 2026-05-06 15:58:05 +02:00
panvk: fix line-rasterization of bifrost
Vulkan defines the line rasterization to *always* use perpendicular rather than aligned line ends (unless otherwise specified by VK_EXT_line_rasterization). So let's remove the code that conditionally sets the bit, we always want the default value (0) here. It might seem confusing because we kinda named this field wrong. It's really about perpendicular vs aligned line ends. That's a cleanup we might want to deal with later, but deleting the assignment is sufficient to fix this issue. This is also what we do for v10. This was probably just copied from the Gallium-driver, where this logic is more or less correct. Fixes:d970fe2e9d("panfrost: Add a Vulkan driver for Midgard/Bifrost GPUs") Reviewed-by: Boris Brezillon <boris.brezillon@collabora.com> Part-of: <https://gitlab.freedesktop.org/mesa/mesa/-/merge_requests/33373> (cherry picked from commit1d64095410)
This commit is contained in:
parent
a1d5a8ea97
commit
5b1fc670a7
3 changed files with 1 additions and 2077 deletions
|
|
@ -14,7 +14,7 @@
|
|||
"description": "panvk: fix line-rasterization of bifrost",
|
||||
"nominated": true,
|
||||
"nomination_type": 2,
|
||||
"resolution": 0,
|
||||
"resolution": 1,
|
||||
"main_sha": null,
|
||||
"because_sha": "d970fe2e9d6a8e9997a0ce212146d62013b3b455",
|
||||
"notes": null
|
||||
|
|
|
|||
File diff suppressed because it is too large
Load diff
|
|
@ -313,8 +313,6 @@ panvk_draw_prepare_fs_rsd(struct panvk_cmd_buffer *cmdbuf,
|
|||
cfg.stencil_mask_misc.alpha_test_compare_function = MALI_FUNC_ALWAYS;
|
||||
cfg.stencil_mask_misc.front_facing_depth_bias = rs->depth_bias.enable;
|
||||
cfg.stencil_mask_misc.back_facing_depth_bias = rs->depth_bias.enable;
|
||||
cfg.stencil_mask_misc.single_sampled_lines =
|
||||
dyns->ms.rasterization_samples <= 1;
|
||||
|
||||
cfg.depth_units = rs->depth_bias.constant_factor;
|
||||
cfg.depth_factor = rs->depth_bias.slope_factor;
|
||||
|
|
|
|||
Loading…
Add table
Reference in a new issue