Emil Svendsen 40aeab6fd5 modetest: util: pattern: add new patterns ... Add three new test patterns: - noise: random black and white pixels - noise-color: random color pixels - black-white: alternate between black and white pixels These patterns are useful for measuring radiated emissions for EMC compliance tests. Signed-off-by: Emil Svendsen <emas@bang-olufsen.dk>		2025-06-09 09:25:29 +02:00
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Android.bp	modetest: Make modetest availble to vendor on Android	2024-10-29 10:49:10 -06:00
Android.sources.bp	Convert to Android.bp	2024-07-29 14:47:30 -04:00
common.h	tests: Split helpers into library	2015-12-18 17:43:40 +00:00
format.c	modetest: add support for YUV422 and YUV444 plane format	2024-09-23 21:11:29 +02:00
format.h	util: store number of colors for indexed formats	2023-10-24 09:44:21 +02:00
kms.c	tests/util: Call drmGetDevices2() instead of drmOpen()ing all modules	2024-09-03 13:30:41 +02:00
kms.h	tests: use drmModeGetConnectorTypeName	2022-07-02 20:13:29 +00:00
meson.build	Add meson build system	2018-01-12 09:40:48 -08:00
pattern.c	modetest: util: pattern: add new patterns	2025-06-09 09:25:29 +02:00
pattern.h	modetest: util: pattern: add new patterns	2025-06-09 09:25:29 +02:00