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libinput/test
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Jonas Ådahl e3f39004a2 test: Don't fail when events are enabled multiple times 
When overriding events of a test device, if one would enable an event
that was already enabled by default for the overridden device, an assert
checking if the event was already enabled would fail and cause the test
to fail.

Since the merging of the default and overriding event lists is implemented
by simply concatinating them letting libevdev deal with ignoring
superfluous event enabling, remove the assert to allow the implementation
to work.

Signed-off-by: Jonas Ådahl <jadahl@gmail.com>
Reviewed-by: Peter Hutterer <peter.hutterer@who-t.net>
2014-08-18 22:35:19 +02:00
..
50-litest.conf test: Prefix litest created device names with litest 2014-06-25 11:11:45 +10:00
build-cxx.cc test: Add include from C++ build test 2014-03-29 00:51:44 +01:00
build-pedantic.c test: add a build-test for -pedantic 2014-01-15 11:26:08 +10:00
keyboard.c test: prefix custom test devices with "litest" 2014-07-04 07:57:59 +10:00
litest-alps-semi-mt.c test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
litest-bcm5974.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-int.h test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
litest-keyboard.c style fix: Remove duplicate empty lines 2014-07-22 09:00:45 +10:00
litest-mouse.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest-synaptics-st.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-synaptics-t440.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-synaptics.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-trackpoint.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest-wacom-touch.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest.c test: Don't fail when events are enabled multiple times 2014-08-18 22:35:19 +02:00
litest.h test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
log.c Merge branch 'ref-counting-context' 2014-06-25 10:32:42 +10:00
Makefile.am test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
misc.c test: prefix custom test devices with "litest" 2014-07-04 07:57:59 +10:00
path.c test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
pointer.c test: fix expected delta from relative motion 2014-07-09 12:39:45 +10:00
touch.c style fix: Remove duplicate empty lines 2014-07-22 09:00:45 +10:00
touchpad.c Use an enum to enable/disable tapping configuration 2014-07-22 08:19:29 +10:00
udev.c test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
valgrind.suppressions test: automatically run the tests against valgrind for leaks 2014-04-10 11:11:56 +10:00