libinput/test
Jonas Ådahl 4be59a972a test: Use only one test device for some udev and path tests
Some tests in test/path.c and test/udev.c are not dependent on
device behaviour but rather managing of device lifetime etc. Run those
tests only once with only one device, resulting more or less the same
code coverage but shorter run time.

Signed-off-by: Jonas Ådahl <jadahl@gmail.com>
Reviewed-by: Peter Hutterer <peter.hutterer@who-t.net>
2014-08-18 22:35:19 +02:00
..
50-litest.conf test: Prefix litest created device names with litest 2014-06-25 11:11:45 +10:00
build-cxx.cc test: Add include from C++ build test 2014-03-29 00:51:44 +01:00
build-pedantic.c test: add a build-test for -pedantic 2014-01-15 11:26:08 +10:00
keyboard.c test: prefix custom test devices with "litest" 2014-07-04 07:57:59 +10:00
litest-alps-semi-mt.c test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
litest-bcm5974.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-int.h test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
litest-keyboard.c style fix: Remove duplicate empty lines 2014-07-22 09:00:45 +10:00
litest-mouse.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest-synaptics-st.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-synaptics-t440.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-synaptics.c test: auto-update for BTN_TOOL_* when using litest_touch_ functions 2014-07-23 15:08:15 +10:00
litest-trackpoint.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest-wacom-touch.c test: drop unused includes for libinput-util.h 2014-06-11 09:43:52 +10:00
litest.c test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
litest.h test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
log.c Merge branch 'ref-counting-context' 2014-06-25 10:32:42 +10:00
Makefile.am test: add a semi-mt Alps test device 2014-08-04 20:21:03 +10:00
misc.c test: prefix custom test devices with "litest" 2014-07-04 07:57:59 +10:00
path.c test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
pointer.c test: fix expected delta from relative motion 2014-07-09 12:39:45 +10:00
touch.c style fix: Remove duplicate empty lines 2014-07-22 09:00:45 +10:00
touchpad.c Use an enum to enable/disable tapping configuration 2014-07-22 08:19:29 +10:00
udev.c test: Use only one test device for some udev and path tests 2014-08-18 22:35:19 +02:00
valgrind.suppressions test: automatically run the tests against valgrind for leaks 2014-04-10 11:11:56 +10:00