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lid: mark the write return value as unused

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Coverity doesn't understand the (void)write() bit and complains about the
unused value.

Signed-off-by: Peter Hutterer <peter.hutterer@who-t.net>
This commit is contained in:
Peter Hutterer 2017-10-09 11:29:47 +10:00
parent 9d96f50c4d
commit 307f7c6344
1 changed files with 2 additions and 1 deletions
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3
src/evdev-lid.c
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@ -78,13 +78,14 @@ lid_switch_keyboard_event(uint64_t time,
return;
if (dispatch->reliability == RELIABILITY_WRITE_OPEN) {
__attribute__((unused)) int rc;
int fd = libevdev_get_fd(dispatch->device->evdev);
struct input_event ev[2] = {
{{ 0, 0 }, EV_SW, SW_LID, 0 },
{{ 0, 0 }, EV_SYN, SYN_REPORT, 0 },
};
(void)write(fd, ev, sizeof(ev));
rc = write(fd, ev, sizeof(ev));
/* In case write() fails, we sync the lid state manually
* regardless. */
}