libevdev/test
Peter Hutterer b77fea9c89 Fix off-by-one errors when dealing with *_MAX values.
LED_MAX, KEY_MAX, ABS_MT_MAX, etc. are all valid event codes

Signed-off-by: Peter Hutterer <peter.hutterer@who-t.net>
Reviewed-by: Benjamin Tissoires <benjamin.tissoires@gmail.com>
2013-08-30 17:40:54 +10:00
..
.gitignore Set up a test harness 2013-06-04 11:39:33 +10:00
Makefile.am test: add uinput creation tests 2013-08-29 13:54:49 +10:00
test-common-uinput.c Fix off-by-one errors when dealing with *_MAX values. 2013-08-30 17:40:54 +10:00
test-common-uinput.h test: switch udev backend over to new libevdev-uinput bits 2013-08-29 13:54:49 +10:00
test-common.c test: define a common device name 2013-07-05 09:11:34 +10:00
test-common.h test: define a common device name 2013-07-05 09:11:34 +10:00
test-event-names.c Fix off-by-one errors when dealing with *_MAX values. 2013-08-30 17:40:54 +10:00
test-int-queue.c test: prepare a common header file for all tests 2013-06-29 18:00:42 +10:00
test-libevdev-events.c Use AC_USE_SYSTEM_EXTENSIONS 2013-08-29 13:54:50 +10:00
test-libevdev-has-event.c Fix off-by-one errors when dealing with *_MAX values. 2013-08-30 17:40:54 +10:00
test-libevdev-init.c test: define a common device name 2013-07-05 09:11:34 +10:00
test-main.c test: add uinput creation tests 2013-08-29 13:54:49 +10:00
test-uinput.c Fix off-by-one errors when dealing with *_MAX values. 2013-08-30 17:40:54 +10:00