Commit graph

5 commits

Author SHA1 Message Date
Behdad Esfahbod
cf1b23a4c5 Add prototype for draw in each test file and remove it from the header. 2006-07-13 12:58:24 -04:00
Behdad Esfahbod
973d3a3d14 More test suite infrastructure improvements:
- Remove cairo_test_expect_failure.  cairo-test.c now checks
  env var CAIRO_XFAIL_TESTS to see if the running test is
  expected to fail.  The reason for expected failure is
  appended to the test description.
- Test description is written out.
- Failed/crashed tests also write a line out to stderr (in red),
  so one can now redirect stdout to /dev/null to only see failures.
- cairo_test() has been changed to not take the draw function
  anymore, instead, draw function is now part of the test struct.
- "make check" doesn't allow limiting backends to test using env
  var anymore.  To limit backends to test, one should use the
  TARGETS variable on the make command line.
- "make check-valgrind" now writes its log to valgrind-log instead
  of valgrind.log, to not interfere with test log file processing.
2006-07-11 22:19:39 -04:00
Behdad Esfahbod
70d3719ec9 Add test device-offset-positive. 2006-06-19 03:20:09 -04:00
Carl Worth
53bf2f8d5d Remove debugging "prints" of images from test/device-offset.c 2006-06-07 10:29:33 -07:00
Carl Worth
22232be759 Note the changed semantics of cairo_surface_set_device_offset
Specifically, device offsets now affect using the offset surface in
a source pattern as well as drawing to the surface. This behavior
os also verified with a new test case: test/device-offset.c
2006-05-24 17:24:52 -07:00