The following four tests are disabled:
gradient-alpha, linear-gradient, text-pattern, trap-clip
We don't use XFAIL as that would disable all backends, (but
we can still usefully use these tests on backends other than
PDF).
- Remove cairo_test_expect_failure. cairo-test.c now checks
env var CAIRO_XFAIL_TESTS to see if the running test is
expected to fail. The reason for expected failure is
appended to the test description.
- Test description is written out.
- Failed/crashed tests also write a line out to stderr (in red),
so one can now redirect stdout to /dev/null to only see failures.
- cairo_test() has been changed to not take the draw function
anymore, instead, draw function is now part of the test struct.
- "make check" doesn't allow limiting backends to test using env
var anymore. To limit backends to test, one should use the
TARGETS variable on the make command line.
- "make check-valgrind" now writes its log to valgrind-log instead
of valgrind.log, to not interfere with test log file processing.
Shrink linear-gradient and text-pattern test outuput.
The real motivation for this is to hide an annoying difference in the
gradient output that occurs when under the influence of a device
offsets. My opinion is that the gradient output should not change due
to just an integer offset, but we currently don't have a precise
gradient specification, so this minor deviation really isn't relevant.
A better fix for this might have been to make the test suite more
forgiving of tiny differences, (perhaps on a per-test basis), but
another advantage of shrinking these tests is that they now run a lot
faster.
It is true that these tests now also exercise fewer different output
values, but that's not the designed purpose of the tests so I don't
feel bad about losing that characteristic.
