2006-12-12 16:49:27 -08:00
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/*
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2006-12-13 18:08:25 -08:00
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Copyright (C) 2006 Yangli Hector Yee
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Copyright (C) 2006 Red Hat, Inc.
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2006-12-12 16:49:27 -08:00
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2006-12-13 18:08:25 -08:00
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This program is free software; you can redistribute it and/or modify it under the terms of the
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GNU General Public License as published by the Free Software Foundation; either version 2 of the License,
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or (at your option) any later version.
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2006-12-12 16:49:27 -08:00
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2006-12-13 18:08:25 -08:00
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This program is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY;
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without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE.
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See the GNU General Public License for more details.
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2006-12-12 16:49:27 -08:00
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2006-12-13 18:08:25 -08:00
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You should have received a copy of the GNU General Public License along with this program;
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if not, write to the Free Software Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA
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2006-12-12 16:49:27 -08:00
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*/
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#ifndef _PDIFF_H
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#define _PDIFF_H
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2008-09-10 18:23:31 +01:00
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#include "cairo.h"
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2006-12-14 03:02:48 -08:00
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2006-12-14 03:49:31 -08:00
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typedef int bool;
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#ifndef true
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#define true 1
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#endif
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#ifndef false
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#define false 0
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#endif
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2006-12-12 16:49:27 -08:00
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/* Image comparison metric using Yee's method (and a cairo interface)
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* References: A Perceptual Metric for Production Testing, Hector Yee, Journal of Graphics Tools 2004
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*/
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int
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pdiff_compare (cairo_surface_t *surface_a,
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cairo_surface_t *surface_b,
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double gamma,
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double luminance,
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double field_of_view);
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#endif
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